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dc.contributor.author
 hal.structure.identifier
INAL, Karim
128006 MECASURF [MECASURF]
dc.contributor.authorPATOOR, Etienne
dc.contributor.author
 hal.structure.identifier
LECOMTE, Jean-Sébastien
1026 Laboratoire d'étude des textures et application aux matériaux [LETAM]
dc.contributor.authorEBERHARDT, André
dc.contributor.author
 hal.structure.identifier
BERVEILLER, Sophie
1104 Laboratoire de physique et mécanique des matériaux [LPMM]
178323 Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux [LEM3]
dc.contributor.authorPESCI, Raphaël
dc.date.accessioned2015
dc.date.available2015
dc.date.issued2006
dc.date.submitted2015
dc.identifier.issn0255-5476
dc.identifier.urihttp://hdl.handle.net/10985/10324
dc.description.abstractA Kossel microdiffraction experimental set up is under development inside a Scanning Electron Microscope (SEM) in order to determine the crystallographic orientation as well as the inter- and intragranular strains and stresses on the micron scale, using a one cubic micrometer spot. The experimental Kossel line patterns are obtained by way of a CCD camera and are then fully indexed using a home-made simulation program. The so-determined orientation is compared with Electron Back-Scattered Diffraction (EBSD) results, and in-situ tests are performed inside the SEM using a tensile/compressive machine. The aim is to verify a 50MPa stress sensitivity for this technique and to take advantage from this microscope environment to associate microstructure observations (slip lines, particle decohesion, crack initiation) with determined stress analyses.
dc.language.isoen
dc.publisherTrans Tech Publications Inc
dc.rightsPost-print
dc.subjectMicrodiffraction
dc.subjectIntragranular stresses
dc.subjectCrystallographic orientation
dc.subjectMicronic scale
dc.titleInter- and Intragranular Stress Determination with Kossel Microdiffraction in a Scanning Electron Microscope
dc.typdocArticle dans une revue avec comité de lecture
dc.localisationCentre de Metz
dc.subject.halSciences de l'ingénieur: Matériaux
ensam.audienceInternationale
ensam.page109-114
ensam.journalMaterials Science Forum
ensam.volume524-525
hal.identifierhal-01213863
hal.version1
hal.submission.permittedupdateFiles
hal.statusaccept
dc.identifier.eissn1662-9760


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