Inter- and Intragranular Stress Determination with Kossel Microdiffraction in a Scanning Electron Microscope
dc.contributor.author
hal.structure.identifier | INAL, Karim
|
dc.contributor.author | PATOOR, Etienne |
dc.contributor.author
hal.structure.identifier | LECOMTE, Jean-Sébastien
|
dc.contributor.author | EBERHARDT, André |
dc.contributor.author
hal.structure.identifier | BERVEILLER, Sophie
|
dc.contributor.author | PESCI, Raphaël |
dc.date.accessioned | 2015 |
dc.date.available | 2015 |
dc.date.issued | 2006 |
dc.date.submitted | 2015 |
dc.identifier.issn | 0255-5476 |
dc.identifier.uri | http://hdl.handle.net/10985/10324 |
dc.description.abstract | A Kossel microdiffraction experimental set up is under development inside a Scanning Electron Microscope (SEM) in order to determine the crystallographic orientation as well as the inter- and intragranular strains and stresses on the micron scale, using a one cubic micrometer spot. The experimental Kossel line patterns are obtained by way of a CCD camera and are then fully indexed using a home-made simulation program. The so-determined orientation is compared with Electron Back-Scattered Diffraction (EBSD) results, and in-situ tests are performed inside the SEM using a tensile/compressive machine. The aim is to verify a 50MPa stress sensitivity for this technique and to take advantage from this microscope environment to associate microstructure observations (slip lines, particle decohesion, crack initiation) with determined stress analyses. |
dc.language.iso | en |
dc.publisher | Trans Tech Publications Inc |
dc.rights | Post-print |
dc.subject | Microdiffraction |
dc.subject | Intragranular stresses |
dc.subject | Crystallographic orientation |
dc.subject | Micronic scale |
dc.title | Inter- and Intragranular Stress Determination with Kossel Microdiffraction in a Scanning Electron Microscope |
dc.typdoc | Article dans une revue avec comité de lecture |
dc.localisation | Centre de Metz |
dc.subject.hal | Sciences de l'ingénieur: Matériaux |
ensam.audience | Internationale |
ensam.page | 109-114 |
ensam.journal | Materials Science Forum |
ensam.volume | 524-525 |
hal.identifier | hal-01213863 |
hal.version | 1 |
hal.submission.permitted | updateFiles |
hal.status | accept |
dc.identifier.eissn | 1662-9760 |