Scaling invariance of fatigue crack growth in gigacycle loading regime
dc.contributor.author
hal.structure.identifier | OBORIN, V.
|
dc.contributor.author
hal.structure.identifier | BANNIKOV, M.V.
|
dc.contributor.author
hal.structure.identifier | NAIMARK, O.B
|
dc.contributor.author
hal.structure.identifier | PALIN-LUC, Thierry
|
dc.date.accessioned | 2016 |
dc.date.available | 2016 |
dc.date.issued | 2010 |
dc.date.submitted | 2016 |
dc.identifier.issn | 1063-7850 |
dc.identifier.uri | http://hdl.handle.net/10985/10516 |
dc.description.abstract | The role of the collective behavior of defect ensembles at the crack tip and the laws of fatigue crack propagation in R4 high-strength steel have been studied under conditions of symmetric tension-compression gigacycle loading at 20 kHz. At every stage of the fatigue crack growth, replicas from the sample side surface were taken and studied by the method of three-dimensional relief profilometry (using NewView interferometer profilometer) so as to study the scaling-invariant laws of defect-related structure evolution. |
dc.description.sponsorship | This study was supported in part by the Russian Foundation for Basic Research, Project nos. 08-01-00699, 09-01-92005-NNS_a, and 09-01-92441-KE_a. |
dc.language.iso | en |
dc.publisher | MAIK Nauka/Interperiodica (МАИК Наука/Интерпериодика) |
dc.rights | Post-print |
dc.subject | very high cycle fatigue |
dc.subject | scaling invariance |
dc.subject | crack growth |
dc.subject | metal |
dc.subject | defects |
dc.title | Scaling invariance of fatigue crack growth in gigacycle loading regime |
dc.identifier.doi | 10.1134/S106378501011026X |
dc.typdoc | Article dans une revue avec comité de lecture |
dc.localisation | Centre de Bordeaux-Talence |
dc.subject.hal | Physique: matière Condensée: Science des matériaux |
dc.subject.hal | Sciences de l'ingénieur: Matériaux |
dc.subject.hal | Sciences de l'ingénieur: Mécanique |
ensam.audience | Internationale |
ensam.page | 1061-1063 |
ensam.journal | Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters |
ensam.volume | 36 |
ensam.issue | 11 |
ensam.peerReviewing | Oui |
hal.identifier | hal-01251159 |
hal.version | 1 |
hal.status | accept |
dc.identifier.eissn | 1090-6533 |