A multi-scale approach of roughness measurements: Evaluation of the relevant scale
dc.contributor.author | VAN GORP, Adrien |
dc.contributor.author | BIGERELLE, Maxence |
dc.contributor.author | GRELLIER, Alain |
dc.contributor.author
hal.structure.identifier | IOST, Alain
|
dc.contributor.author
hal.structure.identifier | NAJJAR, Denis
|
dc.date.accessioned | 2016 |
dc.date.available | 2016 |
dc.date.issued | 2007 |
dc.date.submitted | 2015 |
dc.identifier.issn | 0928-4931 |
dc.identifier.uri | http://hdl.handle.net/10985/10869 |
dc.description.abstract | This paper proposes a new multi-scale measurement approach performed to compare the surface roughness and the visual aspect of polished surfaces. In this investigation, five specimens of glass moulds presenting different visual aspects are considered. All roughness profiles assessed by tactile profilometry were rectified by a first degree polynomial fitting, and current roughness parameters were calculated with respect to the evaluation length among which they are estimated. A variance analysis was then performed to discriminate each roughness parameter and each evaluation length with regard to a correlation with the visual aspect. Although the average roughness amplitude is about 100 nm, the results show that the optimal correlation with the visual aspect is obtained for a 400 μm evaluation length. Moreover, the multi-scale method allows to confirm results already found in the bibliography about the high wavelengths origin of “orange peel” aspect. This application allowed us to conclude on the advantages and the limits of the implemented method. |
dc.language.iso | en |
dc.publisher | Elsevier |
dc.rights | Post-print |
dc.subject | Roughness measurement |
dc.subject | Multi-scale analysis |
dc.subject | Variance analysis |
dc.title | A multi-scale approach of roughness measurements: Evaluation of the relevant scale |
dc.identifier.doi | 10.1016/j.msec.2006.09.041 |
dc.typdoc | Article dans une revue avec comité de lecture |
dc.localisation | Centre de Lille |
dc.subject.hal | Sciences de l'ingénieur: Matériaux |
dc.subject.hal | Sciences de l'ingénieur: Traitement du signal et de l'image |
dc.subject.hal | Statistiques: méthodologie |
ensam.audience | Internationale |
ensam.page | 1434-1438 |
ensam.journal | Materials Science and Engineering: C |
ensam.volume | 27 |
ensam.peerReviewing | Oui |
hal.identifier | hal-01326526 |
hal.version | 1 |
hal.status | accept |