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dc.contributor.author
 hal.structure.identifier
ZHANG, F. G.
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]
233961 Shanghai Jiao Tong University [Shanghai]
dc.contributor.author
 hal.structure.identifier
BORNERT, Michel
204904 Laboratoire Navier [navier umr 8205]
dc.contributor.authorPETIT, J
dc.contributor.author
 hal.structure.identifier
CASTELNAU, Olivier
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]
dc.date.accessioned2017
dc.date.available2017
dc.date.issued2017
dc.date.submitted2017
dc.identifier.issn0909-0495
dc.identifier.urihttp://hdl.handle.net/10985/12359
dc.description.abstractLaue microdiffraction, available at several synchrotron radiation facilities, is well suited for measuring the intragranular stress field in deformed materials thanks to the achievable submicrometer beam size. The traditional method for extracting elastic strain (and hence stress) and lattice orientation from a microdiffraction image relies on fitting each Laue spot with an analytical function to estimate the peak position on the detector screen. The method is thus limited to spots exhibiting ellipsoidal shapes, thereby impeding the study of specimens plastically deformed. To overcome this difficulty, the so-called Laue-DIC method introduces digital image correlation (DIC) for the evaluation of the relative positions of spots, which can thus be of any shape. This paper is dedicated to evaluating the accuracy of this Laue-DIC method. First, a simple image noise model is established and verified on the data acquired at beamline BM32 of the European Synchrotron Radiation Facility. Then, the effect of image noise on errors on spot displacement measured by DIC is evaluated by Monte Carlo simulation. Finally, the combined effect of the image noise, calibration errors and the number of Laue spots used for data treatment is investigated. Results in terms of the uncertainty of stress measurement are provided, and various error regimes are identified.
dc.language.isoen
dc.publisherInternational Union of Crystallography
dc.rightsPost-print
dc.subjectLaue microdiffraction; image noise; digital image correlation; stress analysis.
dc.titleAccuracy of stress measurement by Laue micro¬diffraction (Laue-DIC method): the influence of image noise, calibration errors and spot number
dc.identifier.doi10.1107/S1600577517006622
dc.typdocArticle dans une revue avec comité de lecture
dc.localisationCentre de Paris
dc.subject.halSciences de l'ingénieur: Matériaux
dc.subject.halSciences de l'ingénieur: Mécanique
ensam.audienceInternationale
ensam.page802-817
ensam.journalJournal of Synchrotron Radiation
ensam.volume24
ensam.issue4,
ensam.peerReviewingOui
hal.identifierhal-02142989
hal.version1
hal.date.transferred2019-05-29T06:21:17Z
hal.update-error.statusnewSubmission
hal.submission.permittedtrue
hal.statusaccept
dc.identifier.eissn1600-5775


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