Show simple item record

dc.contributor.author
 hal.structure.identifier
DENG, Siyang
13338 Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
dc.contributor.author
 hal.structure.identifier
EL BECHARI, Reda
13338 Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
dc.contributor.author
 hal.structure.identifier
BRISSET, Stéphane
13338 Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
dc.contributor.author
 hal.structure.identifier
CLENET, Stéphane
13338 Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
dc.date.accessioned2018
dc.date.available2018
dc.date.issued2018
dc.date.submitted2018
dc.identifier.issn0018-9464
dc.identifier.urihttp://hdl.handle.net/10985/12996
dc.description.abstractReliability-Based Design Optimization (RBDO) in electromagnetic field problems requires the calculation of probability of failure leading to a huge computational cost in the case of expensive models. Three different RBDO approaches using kriging surrogate model are proposed to overcome this difficulty by introducing an approximation of the objective function and constraints. These methods use different infill sampling criteria (ISC) to add samples in the process of optimization or/and in the reliability analysis. Several enrichment criteria and strategies are compared in terms of number of evaluations and accuracy of the solution.
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers
dc.rightsPost-print
dc.subjectInfill sampling criteria
dc.subjectKriging model
dc.subjectReliability analysis
dc.subjectReliability based design method
dc.titleIterative Kriging-based Methods for Expensive Black-Box Models
dc.identifier.doi10.1109/TMAG.2017.2767706
dc.typdocArticle dans une revue avec comité de lecture
dc.localisationCentre de Lille
dc.subject.halSciences de l'ingénieur: Energie électrique
ensam.audienceInternationale
ensam.page1-4
ensam.journalIEEE Transactions on Magnetics
ensam.volume54
ensam.issue3
ensam.peerReviewingOui
hal.identifierhal-01769073
hal.version1
hal.statusaccept


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record