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dc.contributor.authorBORIPATKOSOL, Siriwan
dc.contributor.authorLELEU, Stéphane
dc.contributor.author
 hal.structure.identifier
COOREVITS, Thierry
107490 Laboratoire de Métrologie et de Mathématiques Appliquées [L2MA]
dc.contributor.authorGIBARU, Olivier
dc.date.accessioned2014
dc.date.available2014
dc.date.issued2011
dc.date.submitted2014
dc.identifier.urihttp://hdl.handle.net/10985/7746
dc.description.abstractIn this work, the straightness length 300 mm measurement under nanometer uncertainty. The proposed methodology represents a process known as propagation using the assumption of small displacement which leads to solving an overdetermined linear system. The experimental studies were carried out on the capacitive sensors and electronic levels. The least squares mathematic method is apply to calculate the optimal solution. This method requires taking into account the uncertainties of the two different types of sensors leads to method of weighted least squares. The first step is to calibrate the sensors and to estimate the effect on the calculated straightness.
dc.language.isoen
dc.publisherLaboratoire National de Métrologie et d'Essais
dc.rightsPost-print
dc.subjectNanometrology
dc.subjectstraightness
dc.subjectpropagation
dc.titleCALIBRATION OF CAPACITIVE SENSORS AND ELECTRONIC LEVELS FOR THE STRAIGHTNESS MEASUREMENTS USING MULTIPROBE METHOD
dc.typdocCommunication avec acte
dc.localisationCentre de Lille
dc.subject.halSciences de l'ingénieur: Mécanique: Génie mécanique
ensam.audienceInternationale
ensam.conference.titleCongrès International de Métrologie
ensam.conference.date2014-02-06
ensam.countryFrance
ensam.title.proceedingCongrès International de Métrologie
ensam.page?
hal.identifierhal-00941724
hal.version1
hal.statusaccept


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