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dc.contributor.authorLAHOUSSE, Ludovic
dc.contributor.authorBORIPATKOSOL, Siriwan
dc.contributor.authorLELEU, Stéphane
dc.contributor.authorDAVID, Jean-Marie
dc.contributor.authorDUCOURTIEUX, Sébastien
dc.contributor.author
 hal.structure.identifier
COOREVITS, Thierry
107490 Laboratoire de Métrologie et de Mathématiques Appliquées [L2MA]
dc.contributor.authorGIBARU, Olivier
dc.date.accessioned2014
dc.date.available2014
dc.date.issued2008
dc.date.submitted2014
dc.identifier.urihttp://hdl.handle.net/10985/7755
dc.description.abstractThe Laboratoire National de Métrologie et d’Essais (LNE) has developed an innovative ultra precision coordinate measuring machine [LAH07] traceable to the national length standard to measure three-dimensional objects with nanometric uncertainties (figure 1). The measuring range is 300 mm x 300 mm x 50 μm. The objective in term of uncertainty is to reach 30 nm in X and Y directions for a displacement of 300 mm and about few nanometers for a vertical displacement of 50 μm. On this machine, we use four capacitive sensors to measure the position along z direction. These sensors target the flat surface of cylinders (300 mm diameter) used as flatness references. To measure the shape of these aluminum references with nanometric uncertainties, we propose a measurement method based on a propagation process in which we introduce an angular measurement to compensate the curvature error inherent in this method. The measurement process uses the same sensor technology (capacitive sensor) we use on the machine. This paper presents the measurement method, its validation and the first results.
dc.language.isoen
dc.publisherEUSPEN
dc.rightsPost-print
dc.subjectNanometrology
dc.subjectFlatness
dc.titleLNE Activies in Nanometrology: flatness reference calibration algorithm
dc.typdocCommunication avec acte
dc.localisationCentre de Lille
dc.subject.halSciences de l'ingénieur: Mécanique
dc.subject.halSciences de l'ingénieur: Traitement du signal et de l'image
ensam.audienceInternationale
ensam.conference.title8th euspen International Conference
ensam.conference.date2008-05
ensam.countrySwitzerland
ensam.title.proceedingProceedings of the 8th euspen International Conference
ensam.page5
hal.identifierhal-00948037
hal.version1
hal.submission.permittedupdateMetadata
hal.statusaccept


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