LNE Activies in Nanometrology: flatness reference calibration algorithm
dc.contributor.author | LAHOUSSE, Ludovic |
dc.contributor.author | BORIPATKOSOL, Siriwan |
dc.contributor.author | LELEU, Stéphane |
dc.contributor.author | DAVID, Jean-Marie |
dc.contributor.author | DUCOURTIEUX, Sébastien |
dc.contributor.author
hal.structure.identifier | COOREVITS, Thierry
|
dc.contributor.author | GIBARU, Olivier |
dc.date.accessioned | 2014 |
dc.date.available | 2014 |
dc.date.issued | 2008 |
dc.date.submitted | 2014 |
dc.identifier.uri | http://hdl.handle.net/10985/7755 |
dc.description.abstract | The Laboratoire National de Métrologie et d’Essais (LNE) has developed an innovative ultra precision coordinate measuring machine [LAH07] traceable to the national length standard to measure three-dimensional objects with nanometric uncertainties (figure 1). The measuring range is 300 mm x 300 mm x 50 μm. The objective in term of uncertainty is to reach 30 nm in X and Y directions for a displacement of 300 mm and about few nanometers for a vertical displacement of 50 μm. On this machine, we use four capacitive sensors to measure the position along z direction. These sensors target the flat surface of cylinders (300 mm diameter) used as flatness references. To measure the shape of these aluminum references with nanometric uncertainties, we propose a measurement method based on a propagation process in which we introduce an angular measurement to compensate the curvature error inherent in this method. The measurement process uses the same sensor technology (capacitive sensor) we use on the machine. This paper presents the measurement method, its validation and the first results. |
dc.language.iso | en |
dc.publisher | EUSPEN |
dc.rights | Post-print |
dc.subject | Nanometrology |
dc.subject | Flatness |
dc.title | LNE Activies in Nanometrology: flatness reference calibration algorithm |
dc.typdoc | Communication avec acte |
dc.localisation | Centre de Lille |
dc.subject.hal | Sciences de l'ingénieur: Mécanique |
dc.subject.hal | Sciences de l'ingénieur: Traitement du signal et de l'image |
ensam.audience | Internationale |
ensam.conference.title | 8th euspen International Conference |
ensam.conference.date | 2008-05 |
ensam.country | Switzerland |
ensam.title.proceeding | Proceedings of the 8th euspen International Conference |
ensam.page | 5 |
hal.identifier | hal-00948037 |
hal.version | 1 |
hal.submission.permitted | updateMetadata |
hal.status | accept |