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dc.contributor.authorPHUNG, Ngoc-Lam
dc.contributor.authorVALES, Fréderic
dc.contributor.authorMURGHRABI, Haël
dc.contributor.author
 hal.structure.identifier
RANC, Nicolas
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]
dc.contributor.authorFAVIER, Véronique
dc.date.accessioned2014
dc.date.available2014
dc.date.issued2014
dc.date.submitted2014
dc.identifier.issn0142-1123
dc.identifier.urihttp://hdl.handle.net/10985/8062
dc.description.abstractThe surfaces of commercially pure polycrystalline copper specimens subjected to interrupted 20 kHz fatigue tests in the very high cycle fatigue regime were investigated. The stress amplitude needed to form the early slip markings was found twice lower than the stress amplitude required to fracture which confirmed the results obtained by Stanzl-Tschegg et al. (2007). Three types of slip markings were classified according to their morphology and their location in the polycrystalline material. They are compared to slip markings observed during fatigue tests at frequencies lower than 100 Hz and numbers of cycles lower than 107. For 20 kHz fatigue tests, stress amplitudes ranging from 45 MPa to 65 MPa produce straight and long early persistent slip markings located along twin boundaries. Stress amplitudes lower than 45 MPa produce clusters of fine early persistent slip markings mainly located at triple junctions.
dc.language.isoen
dc.publisherElsevier
dc.rightsPost-print
dc.subjectVery high cycle fatigue
dc.subjectPersistent slip bands
dc.subjectGrain boundaries
dc.subjectStrain localization
dc.subjectFatigue limit
dc.titleVery high cycle fatigue of copper: Evolution, morphology and locations of surface slip markings
dc.identifier.doi10.1016/j.ijfatigue.2014.01.007
dc.typdocArticle dans une revue avec comité de lecture
dc.localisationCentre de Paris
dc.subject.halSciences de l'ingénieur: Matériaux
dc.subject.halSciences de l'ingénieur: Mécanique
ensam.audienceInternationale
ensam.page68-77
ensam.journalInternational Journal of Fatigue
ensam.volume63
hal.identifierhal-00985474
hal.version1
hal.statusaccept


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