A quantitative discrete element model to investigate sub-surface damage due to surface polishing
dc.contributor.author | ANDRE, Damien |
dc.contributor.author | CHARLES, Jean-Luc |
dc.contributor.author
hal.structure.identifier | NEAUPORT, Jérôme
|
dc.contributor.author
hal.structure.identifier | IORDANOFF, Ivan
|
dc.date.accessioned | 2014 |
dc.date.available | 2017 |
dc.date.issued | 2012 |
dc.date.submitted | 2014 |
dc.identifier.isbn | 978-0-7918-4487-8 |
dc.identifier.uri | http://hdl.handle.net/10985/8265 |
dc.description.abstract | This work is a continuation of a previous study that investigated sub-surface damage in silica glass due to surface polishing. In this previous study, discrete element models have shown qualitatively good agreement with experiments. The presented work propose a model allowing quantitative results by focusing on the continuous part of the problem. Special attemption was given to the discrete element model of silica glass considered as perfectly isotropic, elastic and brittle. To validate this approach, numerical results are compared to experimental data from literature. |
dc.language.iso | en |
dc.publisher | ASME |
dc.rights | Post-print |
dc.title | A quantitative discrete element model to investigate sub-surface damage due to surface polishing |
ensam.embargo.terms | 50 Years |
dc.identifier.doi | 10.1115/ESDA2012-82509 |
dc.typdoc | Communication avec acte |
dc.localisation | Centre de Bordeaux-Talence |
dc.subject.hal | Mathématique: Analyse numérique |
dc.subject.hal | Sciences de l'ingénieur: Matériaux |
ensam.audience | Non spécifiée |
ensam.conference.title | Proceedings of ASME 2012 11th Biennial Conferences On Engineering Systems Design And Analysis |
ensam.conference.date | 2012-07 |
ensam.country | France |
ensam.title.proceeding | ASME 2012 11th Biennial Conference on Engineering Systems Design and Analysis |
ensam.page | 577-585 |
ensam.volume | 4 : Advanced Manufacturing Processes; Biomedical Engineering; Multiscale Mechanics of Biological Tissues; Sciences, Engineering and Education; Multiphysics; Emerging Technologies for Inspection |
hal.identifier | hal-01007057 |
hal.version | 1 |
hal.submission.permitted | updateMetadata |
hal.status | accept |