Scaling Invariance of Fatigue Crack Growth in Gigacycle Loading Regime
dc.contributor.author | OBORIN, V. |
dc.contributor.author | BANNIKOV, M.V. |
dc.contributor.author | NAIMARK, O.B |
dc.contributor.author
hal.structure.identifier | PALIN-LUC, Thierry
|
dc.date.accessioned | 2014 |
dc.date.available | 2014 |
dc.date.issued | 2010 |
dc.date.submitted | 2014 |
dc.identifier.issn | 1063-7850 |
dc.identifier.uri | http://hdl.handle.net/10985/8819 |
dc.description.abstract | The role of the collective behavior of defect ensembles at the crack tip and the laws of fatigue crack propagation in R4 high strength steel have been studied under conditions of symmetric tension–compression gigacycle loading at 20 kHz. At every stage of the fatigue crack growth, replicas from the sample side surface were taken and studied by the method of three dimensional relief profilometry (using NewView interferometer profilometer) so as to study the scaling invariant laws of defect related structure evolution. |
dc.description.sponsorship | This study was supported in part by the Russian Foundation for Basic Research, Project nos. 08-01-00699, 09-01-92005-NNS_a, and 09-01-92441-KE-a |
dc.language.iso | en |
dc.publisher | MAIK Nauka/Interperiodica (МАИК Наука/Интерпериодика) |
dc.rights | Post-print |
dc.subject | Fatigue |
dc.subject | Crack growth |
dc.subject | Scaling invariance |
dc.title | Scaling Invariance of Fatigue Crack Growth in Gigacycle Loading Regime |
dc.identifier.doi | 10.1134/S106378501011026X |
dc.typdoc | Article dans une revue avec comité de lecture |
dc.localisation | Centre de Bordeaux-Talence |
dc.subject.hal | Physique: matière Condensée: Science des matériaux |
dc.subject.hal | Sciences de l'ingénieur: Mécanique: Mécanique des matériaux |
dc.subject.hal | Sciences de l'ingénieur: Mécanique: Mécanique des solides |
ensam.audience | Internationale |
ensam.page | 1061–1063 |
ensam.journal | Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters |
ensam.volume | 36 |
ensam.issue | 11 |
hal.status | unsent |
dc.identifier.eissn | 1090-6533 |