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dc.contributor.authorPETIT, J
dc.contributor.author
 hal.structure.identifier
CASTELNAU, Olivier
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]
dc.contributor.author
 hal.structure.identifier
BORNERT, Michel
204904 Laboratoire Navier [navier umr 8205]
dc.contributor.author
 hal.structure.identifier
ZHANG, F. G.
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]
dc.contributor.authorHOFMANN, F
dc.contributor.authorKORSUNSKY, A. M
dc.contributor.author
 hal.structure.identifier
FAURIE, D
233425 Laboratoire des Sciences des Procédés et des Matériaux [LSPM]
dc.contributor.authorLE BOURLOT, C
dc.contributor.authorMICHA, Jean-Sébastien
dc.contributor.authorROBACH, O
dc.contributor.authorULRICH, O
dc.date.accessioned2015
dc.date.available2015
dc.date.issued2015
dc.date.submitted2015
dc.identifier.issn0909-0495
dc.identifier.urihttp://hdl.handle.net/10985/9890
dc.description.abstractA better understanding of the effective mechanical behavior of polycrystalline materials requires an accurate knowledge of the behavior at a scale smaller than the grain size. The X-ray Laue microdiffraction technique available at beamline BM32 at the European Synchrotron Radiation Facility is ideally suited for probing elastic strains (and associated stresses) in deformed polycrystalline materials with a spatial resolution smaller than a micrometer. However, the standard technique used to evaluate local stresses from the distortion of Laue patterns lacks accuracy for many micromechanical applications, mostly due to (i) the fitting of Laue spots by analytical functions, and (ii) the necessary comparison of the measured pattern with the theoretical one from an unstrained reference specimen. In the present paper, a new method for the analysis of Laue images is presented. A Digital Image Correlation (DIC) technique, which is essentially insensitive to the shape of Laue spots, is applied to measure the relative distortion of Laue patterns acquired at two different positions on the specimen. The new method is tested on an in situ deformed Si single-crystal, for which the prescribed stress distribution has been calculated by finite-element analysis. It is shown that the new Laue-DIC method allows determination of local stresses with a strain resolution of the order of 10-5.
dc.language.isoen
dc.publisherInternational Union of Crystallography
dc.rightsPost-print
dc.subjectX-ray diffraction
dc.subjectmicrobeam
dc.subjectstress field
dc.subjectelastic strain
dc.titleLaue-DIC : a new method for improved stress field measurements at the micrometer scale
dc.identifier.doi10.1107/S1600577515005780
dc.typdocArticle dans une revue avec comité de lecture
dc.localisationCentre de Paris
dc.subject.halSciences de l'ingénieur: Matériaux
dc.subject.halSciences de l'ingénieur: Mécanique
ensam.audienceInternationale
ensam.page980-994.
ensam.journalJournal of Synchrotron Radiation
ensam.volume22
hal.identifierhal-01191406
hal.version1
hal.statusaccept
dc.identifier.eissn1600-5775


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