Structural and magnetic properties of Co2MnSi thin films
dc.contributor.author
hal.structure.identifier | BELMEGUENAI, M
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dc.contributor.author
hal.structure.identifier | ZIGHEM, F
|
dc.contributor.author
hal.structure.identifier | FAURIE, D
|
dc.contributor.author
hal.structure.identifier | TUZCUOGLU, H.
|
dc.contributor.author
hal.structure.identifier | CHERIF, Salim Mourad
|
dc.contributor.author
hal.structure.identifier | WESTERHOLT, K
|
dc.contributor.author
hal.structure.identifier | SEILER, Wilfrid
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dc.contributor.author
hal.structure.identifier | MOCH, P
|
dc.date.accessioned | 2015 |
dc.date.available | 2015 |
dc.date.issued | 2012 |
dc.date.submitted | 2015 |
dc.identifier.issn | 1610-1634 |
dc.identifier.uri | http://hdl.handle.net/10985/9916 |
dc.description.abstract | Co2MnSi (CMS) films of different thicknesses (20, 50, and 100 nm) were grown by radio frequency (RF) sputtering on a-plane sapphire substrates. Our X-rays diffraction (XRD) study shows that, in all the samples, the cubic 〈110〉 CMS axis is normal to the substrate and that six well defined preferential in-plane orientations are present. Static and dynamic magnetic properties were investigated using vibrating sample magnetometry (VSM) and microstrip line ferromagnetic resonance (MS-FMR), respectively. From the resonance measurements versus the direction and the amplitude of an applied magnetic field, most of the magnetic parameters are derived, i.e.: the magnetization, the gyromagnetic factor, the exchange stiffness coefficient, and the magnetic anisotropy terms. The in-plane anisotropy results from the superposition of two terms showing a twofold and a fourfold symmetry, respectively. The observed behavior of the hysteresis loops is in agreement with this complex form of the in-plane anisotropy. |
dc.language.iso | en |
dc.publisher | Wiley |
dc.rights | Post-print |
dc.subject | ferromagnetic resonance |
dc.subject | Heusler alloys |
dc.subject | magnetic anisotropy |
dc.subject | spin waves |
dc.title | Structural and magnetic properties of Co2MnSi thin films |
dc.identifier.doi | 10.1002/pssa.201228039 |
dc.typdoc | Article dans une revue avec comité de lecture |
dc.localisation | Centre de Paris |
dc.subject.hal | Sciences de l'ingénieur: Matériaux |
dc.subject.hal | Sciences de l'ingénieur: Mécanique |
ensam.audience | Internationale |
ensam.page | 1328-1333. |
ensam.journal | physica status solidi (c) |
ensam.volume | 209 |
hal.identifier | hal-01193055 |
hal.version | 1 |
hal.submission.permitted | updateMetadata |
hal.status | accept |
dc.identifier.eissn | 1610-1642 |