Local stress analysis in an SMA during stress-induced martensitic transformation by Kossel microdiffraction
dc.contributor.author | BOUSCAUD, Denis |
dc.contributor.author | PATOOR, Etienne |
dc.contributor.author
hal.structure.identifier | MORAWIEC, Adam
|
dc.contributor.author
hal.structure.identifier | BERVEILLER, Sophie
|
dc.contributor.author | PESCI, Raphaël |
dc.date.accessioned | 2015 |
dc.date.available | 2015 |
dc.date.issued | 2014 |
dc.date.submitted | 2015 |
dc.identifier.issn | 1662-8985 |
dc.identifier.uri | http://hdl.handle.net/10985/9942 |
dc.description.abstract | The Kossel microdiffraction in a scanning electron microscope allows for local stress determination. This technique has been applied to monitor stress evolution within grains of austenite in the course of martensitic transformation in a shape memory alloy. Kossel diffraction patterns were recorded during in situ tensile straining of Cu-Al-Be alloy. These innovative measurements show large stress heterogeneities between grains, with the stress ratio exceeding two. As martensite variants are stress-induced, shear stress components appear in individual grains of austenite. |
dc.language.iso | en |
dc.publisher | Trans Tech Publications |
dc.rights | Post-print |
dc.subject | Kossel microdiffraction |
dc.subject | scanning electron microscopy |
dc.subject | in-situ straining |
dc.subject | martensitic transformation |
dc.title | Local stress analysis in an SMA during stress-induced martensitic transformation by Kossel microdiffraction |
dc.identifier.doi | 10.4028/www.scientific.net/AMR.996.45 |
dc.typdoc | Communication avec acte |
dc.localisation | Centre de Metz |
dc.subject.hal | Sciences de l'ingénieur: Mécanique: Mécanique des matériaux |
ensam.audience | Internationale |
ensam.conference.title | European Conference on Residual Stresses |
ensam.conference.date | 2014-07 |
ensam.country | France |
ensam.title.proceeding | Advanced Materials Research |
ensam.page | 45-51 |
ensam.volume | 996 |
ensam.city | Troyes |
hal.identifier | hal-01195585 |
hal.version | 1 |
hal.status | accept |