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<pubDate xmlns="http://apache.org/cocoon/i18n/2.1">Sun, 14 Jun 2026 10:27:52 GMT</pubDate>
<dc:date>2026-06-14T10:27:52Z</dc:date>
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<title>X-ray strain analysis of {111} fiber-textured thin films independent of grain-interaction models</title>
<link>http://hdl.handle.net/10985/15115</link>
<description>X-ray strain analysis of {111} fiber-textured thin films independent of grain-interaction models
FAURIE, Damien; RENAULT, Pierre Olivier; LE BOURHIS, E; CHAUVEAU, Thierry; CASTELNAU, Olivier; GOUDEAU, Philippe H.
The anisotropic elastic response of supported thin films with a {111} fiber texture has been studied using an in-situ micro-tensile tester and X-ray diffractometry. It is shown which specific X-ray diffraction measurement geometries can be used to analyze the elastic strains in thin films without requiring any assumptions regarding elastic interactions between grains. It is evidenced (theoretically and experimentally) that the combination of two specific geometries leads to a simple linear relationship between the measured strains and the geometrical variable sin 2 , avoiding the transition scale models. The linear fit of the experimental data allows a direct determination of the relationship between the three single-crystal elastic compliances or a direct determination of the S 44 single-crystal elastic compliance and the combination of S 11 + 2S 12 if the macroscopic stress is known. This methodology has been applied to a model system, i.e. gold film for which no size effect is expected, deposited on polyimide substrate, and it was found that S 44 = 23.2 TPa -1 and S 11 + 2S 12 = 1.9 TPa -1 , in good accordance with values for large crystals of gold. © 2011 International Union of Crystallography Printed in Singapore - all rights reserved.
</description>
<pubDate>Sat, 01 Jan 2011 00:00:00 GMT</pubDate>
<guid isPermaLink="false">http://hdl.handle.net/10985/15115</guid>
<dc:date>2011-01-01T00:00:00Z</dc:date>
<dc:creator>FAURIE, Damien</dc:creator>
<dc:creator>RENAULT, Pierre Olivier</dc:creator>
<dc:creator>LE BOURHIS, E</dc:creator>
<dc:creator>CHAUVEAU, Thierry</dc:creator>
<dc:creator>CASTELNAU, Olivier</dc:creator>
<dc:creator>GOUDEAU, Philippe H.</dc:creator>
<dc:description>The anisotropic elastic response of supported thin films with a {111} fiber texture has been studied using an in-situ micro-tensile tester and X-ray diffractometry. It is shown which specific X-ray diffraction measurement geometries can be used to analyze the elastic strains in thin films without requiring any assumptions regarding elastic interactions between grains. It is evidenced (theoretically and experimentally) that the combination of two specific geometries leads to a simple linear relationship between the measured strains and the geometrical variable sin 2 , avoiding the transition scale models. The linear fit of the experimental data allows a direct determination of the relationship between the three single-crystal elastic compliances or a direct determination of the S 44 single-crystal elastic compliance and the combination of S 11 + 2S 12 if the macroscopic stress is known. This methodology has been applied to a model system, i.e. gold film for which no size effect is expected, deposited on polyimide substrate, and it was found that S 44 = 23.2 TPa -1 and S 11 + 2S 12 = 1.9 TPa -1 , in good accordance with values for large crystals of gold. © 2011 International Union of Crystallography Printed in Singapore - all rights reserved.</dc:description>
</item>
<item>
<title>Elastic anisotropy of polycrystalline Au films: Modeling and respective contributions of X-ray diffraction, nanoindentation and Brillouin light scattering</title>
<link>http://hdl.handle.net/10985/15317</link>
<description>Elastic anisotropy of polycrystalline Au films: Modeling and respective contributions of X-ray diffraction, nanoindentation and Brillouin light scattering
FAURIE, Damien; DJÉMIA, Ph; LE BOURHIS, Éric; RENAULT, P.O.; ROUSSIGNÉ, Yves E; CHERIF, Salim Mourad; CASTELNAU, Olivier; PATRIARCHE, Gilles; GOUDEAU, Philippe H.; BRENNER, Renald
Elastic properties of non-textured and {1 1 1}-fiber-textured gold thin films were investigated experimentally by several complementary techniques, namely in situ tensile testing under X-ray diffraction (XRD), nanoindentation and Brillouin light scattering (BLS). Specimens were probed along different directions to reveal the strong effects of elastic anisotropy at the (local) grain and (global) film scales. XRD allows the investigation of both local and global anisotropies, while BLS and nanoindentation are limited to global analyses. A micromechanical model, based on the self-consistent scheme, and accounting for the actual microstructure of the films, is applied to interpret experimental data. Although different types of elastic constants can be determined with the used experimental techniques (static/dynamic, local/global), a good agreement is obtained, showing that comparison of these techniques is feasible when carried out carefully. In particular, the use of a micromechanical model to estimate the effects of the local elastic anisotropy at the film scale is unavoidable. The presented results show that XRD, BLS and nanoindentation should capture anisotropic texture effects on elastic constants measurements for materials with a Zener anisotropy index larger than 2. Conversely, the actual texture of a given specimen should be taken into account for a proper analysis of elastic constants measurements using those three experimental techniques.
</description>
<pubDate>Fri, 01 Jan 2010 00:00:00 GMT</pubDate>
<guid isPermaLink="false">http://hdl.handle.net/10985/15317</guid>
<dc:date>2010-01-01T00:00:00Z</dc:date>
<dc:creator>FAURIE, Damien</dc:creator>
<dc:creator>DJÉMIA, Ph</dc:creator>
<dc:creator>LE BOURHIS, Éric</dc:creator>
<dc:creator>RENAULT, P.O.</dc:creator>
<dc:creator>ROUSSIGNÉ, Yves E</dc:creator>
<dc:creator>CHERIF, Salim Mourad</dc:creator>
<dc:creator>CASTELNAU, Olivier</dc:creator>
<dc:creator>PATRIARCHE, Gilles</dc:creator>
<dc:creator>GOUDEAU, Philippe H.</dc:creator>
<dc:creator>BRENNER, Renald</dc:creator>
<dc:description>Elastic properties of non-textured and {1 1 1}-fiber-textured gold thin films were investigated experimentally by several complementary techniques, namely in situ tensile testing under X-ray diffraction (XRD), nanoindentation and Brillouin light scattering (BLS). Specimens were probed along different directions to reveal the strong effects of elastic anisotropy at the (local) grain and (global) film scales. XRD allows the investigation of both local and global anisotropies, while BLS and nanoindentation are limited to global analyses. A micromechanical model, based on the self-consistent scheme, and accounting for the actual microstructure of the films, is applied to interpret experimental data. Although different types of elastic constants can be determined with the used experimental techniques (static/dynamic, local/global), a good agreement is obtained, showing that comparison of these techniques is feasible when carried out carefully. In particular, the use of a micromechanical model to estimate the effects of the local elastic anisotropy at the film scale is unavoidable. The presented results show that XRD, BLS and nanoindentation should capture anisotropic texture effects on elastic constants measurements for materials with a Zener anisotropy index larger than 2. Conversely, the actual texture of a given specimen should be taken into account for a proper analysis of elastic constants measurements using those three experimental techniques.</dc:description>
</item>
<item>
<title>Elastic-strain distribution in metallic film-polymer substrate composites</title>
<link>http://hdl.handle.net/10985/18682</link>
<description>Elastic-strain distribution in metallic film-polymer substrate composites
GEANDIER, Guillaume; RENAULT, Pierre Olivier; LE BOURHIS, Éric; GOUDEAU, Philippe H.; FAURIE, Damien; LE BOURLOT, Christophe; DJ́MIA, Ph; CASTELNAU, Olivier; CH́RIF, S. M.
Synchrotron x-ray radiation was used for in situ strain measurements during uniaxial tests on polymer substrates coated by a metallic gold film 400 nm thick deposited without interlayer or surface treatment. X-ray diffraction allowed capturing both components elastic strains and determining how these were partitioned between the metallic film and the polymeric substrate. For strains below 0.8%, deformation is continuous through the metal-polymer interface while above, the onset of plasticity in the metallic film induces a shift between film and substrate elastic strains.
</description>
<pubDate>Fri, 01 Jan 2010 00:00:00 GMT</pubDate>
<guid isPermaLink="false">http://hdl.handle.net/10985/18682</guid>
<dc:date>2010-01-01T00:00:00Z</dc:date>
<dc:creator>GEANDIER, Guillaume</dc:creator>
<dc:creator>RENAULT, Pierre Olivier</dc:creator>
<dc:creator>LE BOURHIS, Éric</dc:creator>
<dc:creator>GOUDEAU, Philippe H.</dc:creator>
<dc:creator>FAURIE, Damien</dc:creator>
<dc:creator>LE BOURLOT, Christophe</dc:creator>
<dc:creator>DJ́MIA, Ph</dc:creator>
<dc:creator>CASTELNAU, Olivier</dc:creator>
<dc:creator>CH́RIF, S. M.</dc:creator>
<dc:description>Synchrotron x-ray radiation was used for in situ strain measurements during uniaxial tests on polymer substrates coated by a metallic gold film 400 nm thick deposited without interlayer or surface treatment. X-ray diffraction allowed capturing both components elastic strains and determining how these were partitioned between the metallic film and the polymeric substrate. For strains below 0.8%, deformation is continuous through the metal-polymer interface while above, the onset of plasticity in the metallic film induces a shift between film and substrate elastic strains.</dc:description>
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