• français
    • English
    English
  • Ouvrir une session
Aide
Voir le document 
  •   Accueil de SAM
  • Laboratoire Procédés et Ingénierie en Mécanique et Matériaux (PIMM)
  • Voir le document
  • Accueil de SAM
  • Laboratoire Procédés et Ingénierie en Mécanique et Matériaux (PIMM)
  • Voir le document
JavaScript is disabled for your browser. Some features of this site may not work without it.

Elastic anisotropy of polycrystalline Au films: Modeling and respective contributions of X-ray diffraction, nanoindentation and Brillouin light scattering

Article dans une revue avec comité de lecture
Auteur
FAURIE, Damien
239210 Laboratoire des Propriétés Mécaniques et Thermodynamiques des Matériaux [LPMTM]
DJÉMIA, Ph
LE BOURHIS, Éric
118112 Institut Pprime [UPR 3346] [PPrime [Poitiers]]
RENAULT, P.O.
118112 Institut Pprime [UPR 3346] [PPrime [Poitiers]]
ROUSSIGNÉ, Yves E
CHERIF, Salim Mourad
CASTELNAU, Olivier
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]
PATRIARCHE, Gilles
411 Laboratoire de photonique et de nanostructures [LPN]
GOUDEAU, Philippe H.
118112 Institut Pprime [UPR 3346] [PPrime [Poitiers]]
BRENNER, Renald
233425 Laboratoire des Sciences des Procédés et des Matériaux [LSPM]

URI
http://hdl.handle.net/10985/15317
DOI
10.1016/j.actamat.2010.05.034
Date
2010
Journal
Acta Materialia

Résumé

Elastic properties of non-textured and {1 1 1}-fiber-textured gold thin films were investigated experimentally by several complementary techniques, namely in situ tensile testing under X-ray diffraction (XRD), nanoindentation and Brillouin light scattering (BLS). Specimens were probed along different directions to reveal the strong effects of elastic anisotropy at the (local) grain and (global) film scales. XRD allows the investigation of both local and global anisotropies, while BLS and nanoindentation are limited to global analyses. A micromechanical model, based on the self-consistent scheme, and accounting for the actual microstructure of the films, is applied to interpret experimental data. Although different types of elastic constants can be determined with the used experimental techniques (static/dynamic, local/global), a good agreement is obtained, showing that comparison of these techniques is feasible when carried out carefully. In particular, the use of a micromechanical model to estimate the effects of the local elastic anisotropy at the film scale is unavoidable. The presented results show that XRD, BLS and nanoindentation should capture anisotropic texture effects on elastic constants measurements for materials with a Zener anisotropy index larger than 2. Conversely, the actual texture of a given specimen should be taken into account for a proper analysis of elastic constants measurements using those three experimental techniques.

Fichier(s) constituant cette publication

Nom:
PIMM - ACTM- FAURIE- 2010.pdf
Taille:
1.082Mo
Format:
PDF
Voir/Ouvrir

Cette publication figure dans le(s) laboratoire(s) suivant(s)

  • Laboratoire Procédés et Ingénierie en Mécanique et Matériaux (PIMM)

Documents liés

Visualiser des documents liés par titre, auteur, créateur et sujet.

  • Elastic-strain distribution in metallic film-polymer substrate composites 
    Article dans une revue avec comité de lecture
    GEANDIER, Guillaume; RENAULT, Pierre Olivier; LE BOURHIS, Éric; GOUDEAU, Philippe H.; FAURIE, Damien; LE BOURLOT, Christophe; DJ́MIA, Ph; CASTELNAU, Olivier; CH́RIF, S. M. (American Institute of Physics, 2010)
    Synchrotron x-ray radiation was used for in situ strain measurements during uniaxial tests on polymer substrates coated by a metallic gold film 400 nm thick deposited without interlayer or surface treatment. X-ray diffraction ...
  • Peculiar effective elastic anisotropy of nanometric multilayers studied by surface Brillouin scattering 
    Article dans une revue avec comité de lecture
    FAURIE, D; DJEMIA, P; CASTELNAU, Olivier; BRENNER, Renald; BELLIARD, L; GOUDEAU, P; RENAULT, P.-O; LE BOURHIS, E (Elsevier, 2015)
    We show in this paper by using a two-scale transition model that the elastic anisotropy of a thin film specimen can be tuned by appropriate stacking design. The anisotropic behaviour is illustrated for two monophase thin ...
  • X-ray strain analysis of {111} fiber-textured thin films independent of grain-interaction models 
    Article dans une revue avec comité de lecture
    FAURIE, Damien; RENAULT, Pierre Olivier; LE BOURHIS, E; CHAUVEAU, Thierry; CASTELNAU, Olivier; GOUDEAU, Philippe H. (International Union of Crystallography, 2011)
    The anisotropic elastic response of supported thin films with a {111} fiber texture has been studied using an in-situ micro-tensile tester and X-ray diffractometry. It is shown which specific X-ray diffraction measurement ...
  • Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction 
    Article dans une revue avec comité de lecture
    DJAZIRI, Soundes; THIAUDIÈRE, Dominique; GEANDIER, Guillaume; RENAULT, Pierre Olivier; LE BOURHIS, Éric; GOUDEAU, P; CASTELNAU, Olivier; FAURIE, D (Elsevier, 2010)
    The deformation behaviour of 150. nm thick W/Cu nanocomposite deposited on polyimide substrates has been analysed under equi-biaxial tensile testing coupled to X-ray diffraction technique. The experiments were carried out ...
  • Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector 
    Article dans une revue avec comité de lecture
    LE BOURLOT, C; LANDOIS, P; DJAZIRI, S; RENAULT, P.-O; LE BOURHIS, E; GOUDEAU, P; MAYNE-L’HERMITE, M; BACROIX, Brigitte; PINAULT, M; FAURIE, D; CASTELNAU, Olivier; LAUNOIS, P; ROUZIERE, S (International Union of Crystallography, 2012)
    A prototype X-ray pixel area detector (XPAD3.1) has been used for X-ray diffraction experiments with synchrotron radiation. The characteristics of this detector are very attractive in terms of fast readout time, high dynamic ...

Parcourir

Tout SAMLaboratoiresAuteursDates de publicationCampus/InstitutsCe LaboratoireAuteursDates de publicationCampus/Instituts

Lettre Diffuser la Science

Dernière lettreVoir plus

Statistiques de consultation

Publications les plus consultéesStatistiques par paysAuteurs les plus consultés

ÉCOLE NATIONALE SUPERIEURE D'ARTS ET METIERS

  • Contact
  • Mentions légales

ÉCOLE NATIONALE SUPERIEURE D'ARTS ET METIERS

  • Contact
  • Mentions légales