Identification of relevant wavelet functions for multiscale characterization of manufactured surfaces using a genetically optimized neural network

Abstract

Multiscale surface characterization is a powerful tool that is used for process monitoring, surface quality control, and manufacturing optimization by establishing a link between process variables and functional performances. The multiscale decomposition approach using continuous and discrete wavelets is widely applied to take into account scales dependency. However, the optimal choice of the analysis wavelet function and the number of decomposition level is still a big issue. In this article, the artificial neural network theory was combined with the wavelet concept and was optimized based on the genetic algorithm to identify the relevant wavelet function for multiscale characterization of abraded surface topographies. Then, an extensive wavelet function library was developed and the proposed algorithm was applied to topographic data obtained from various abrasive finishing processes. The results show the pertinence of this approach to select the relevant wavelet, and a universal relevant wavelet function for abraded surface characterization was determined.