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Sensitivity Analysis for Simulated Annealing-Based Fitting of CAD Models to Point Clouds of Digitized Parts

Chapitre d'ouvrage
Auteur
SHAH, Ghazanfar Ali
176013 Istituto per la Matematica Applicata e Tecnologie Informatiche di Genova
GIANNINI, Franca
176013 Istituto per la Matematica Applicata e Tecnologie Informatiche di Genova
MONTI, Marina
176013 Istituto per la Matematica Applicata e Tecnologie Informatiche di Genova
ccPERNOT, Jean-Philippe
543315 Laboratoire d’Ingénierie des Systèmes Physiques et Numériques [LISPEN]
ccPOLETTE, Arnaud

URI
http://hdl.handle.net/10985/23483
DOI
10.1007/978-3-030-70566-4_44
Date
2021-04-22

Résumé

AbstractThis paper addresses the way a simulated annealing-based fitting strategy can be enhanced by leveraging a sensitivity analysis able to characterize the impact of the variations in the parameters of a CAD model on the evolution of the deviation between the CAD model itself and the point cloud of the digitized part to be fitted. The principles underpinning the adopted fitting algorithm are briefly recalled. The applied sensitivity analysis is described together with the comparison of the resulting sensitivity evolution curves with the changes in the CAD model parameters imposed by the simulated annealing algorithm. This analysis suggests several possible improvements that are discussed. The overall approach is illustrated on the fitting of single mechanical parts but it can be directly extended to the fitting of parts’ assemblies. It is particularly interesting in the context of the Industry 4.0 to update digital twins of physical products and systems.

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Documents liés

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  • Case‑based tuning of a metaheuristic algorithm exploiting sensitivity analysis and design of experiments for reverse engineering applications 
    Article dans une revue avec comité de lecture
    ccSHAH GHAZANFAR, Ali; ccPOLETTE, Arnaud; ccPERNOT, Jean-Philippe; GIANNINI, Franca; MONTI, Marina (SPRINGER, 2022-03-17)
    Due to its capacity to evolve in a large solution space, the Simulated Annealing (SA) algorithm has shown very promising results for the Reverse Engineering of editable CAD geometries including parametric 2D sketches, ...
  • User-Driven Computer-Assisted Reverse Engineering of Editable CAD Assembly Models 
    Article dans une revue avec comité de lecture
    ccSHAH GHAZANFAR, Ali; GIANNINI, Franca; MONTI, Marina; ccPERNOT, Jean-Philippe; ccPOLETTE, Arnaud (ASME, 2021-12-16)
    This paper introduces a novel reverse engineering (RE) technique for the reconstruction of editable computer-aided design (CAD) models of mechanical parts’ assemblies. The input is a point cloud of a mechanical parts’ ...
  • Simulated annealing-based fitting of CAD models to point clouds of mechanical parts’ assemblies 
    Article dans une revue avec comité de lecture
    ccSHAH GHAZANFAR, Ali; GIANNINI, Franca; MONTI, Marina; ccPERNOT, Jean-Philippe; ccPOLETTE, Arnaud (Springer Science and Business Media LLC, 2020-02-18)
    This paper introduces a new ftting approach to allow an efcient part-by-part reconstruction or update of editable CAD models fitting the point cloud of a digitized mechanical parts′ assembly. The idea is to make use ...
  • As-scanned point clouds generation for virtual Reverse Engineering of CAD assembly models 
    Article dans une revue avec comité de lecture
    MONTLAHUC, Jérémy; ccSHAH GHAZANFAR, Ali; ccPERNOT, Jean-Philippe; ccPOLETTE, Arnaud (CAD Solutions LLC (imprimé) and Taylor & Francis Online (en ligne), 2019)
    This paper introduces a new approach for the generation of as-scanned point clouds of CAD assembly models. The resulting point clouds incorporate various realistic artifacts that would appear if the corresponding real ...
  • Multi-criteria retrieval of CAD assembly models 
    Article dans une revue avec comité de lecture
    LUPINETTI, Katia; GIANNINI, Franca; MONTI, Marina; ccPERNOT, Jean-Philippe (Elsevier, 2018)
    Being able to reuse existing design knowledge is of major interest to help designers during the creation of new products. This is true at the level of the parts and even more at the level of the assemblies of multiple ...

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