New Mother Wavelet for Pattern Detection in IR Image

Abstract

The paper presents a new mother wavelet adapted from a specific pattern. Wavelet multi-resolution analysis uses this wavelet to detect the position of the pattern in an Infra-Red (IR) signal under scale variation and the presence of noise. IR signal is extracted from IR image sequence recorded by an IR camera, Time of Flight (TOF) sensor configuration. The maximum correlation between the pattern and the signal of interest will be used as a criterion to define the mother wavelet. The proposed mother wavelet were tested and verified under the scale variation and the presence of noise. The experimental tests and performance analysis show promising results for both scale variation and noisy signal. 90% accuracy for the proposed wavelet under intensive noisy condition (50% of the signal amplitude) is guaranteed and high precision is expected under real condition.