Optical measurement of a temperature of an object, and associated cartography

Abstract

The subject of the present invention relates to an optical process for measuring a variation in the temperature of an abject (0), comprising: an emitting step (Sl) consisting in emitting, in the direction of said abject (0), a first incident terahertz elec - tromagnetic wave (Wl_inc), and a measuring step (S2) comprising measuring (S2_3), using a sensor sensitive to terahertz radiation (20), a variation in the amplitude of the electromagnetic radiation of a second electromagnetic wave (W2_ref, W2_tra) in order to determine the variation in the temperature of said abject (0).