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Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector

Type
Articles dans des revues avec comité de lecture
Author
LE BOURLOT, C
86289 Procédés et Ingénierie en Mécanique et Matériaux [Paris] [PIMM]
233425 Laboratoire des Sciences des Procédés et des Matériaux [LSPM]
LANDOIS, P
134 Laboratoire de Physique des Solides [LPS]
DJAZIRI, S
118112 Institut Pprime [PPRIME]
RENAULT, P.-O
118112 Institut Pprime [PPRIME]
LE BOURHIS, E
118112 Institut Pprime [PPRIME]
GOUDEAU, P
118112 Institut Pprime [PPRIME]
MAYNE-L’HERMITE, M
1400 Laboratoire Francis PERRIN [LFP - URA 2453]
BACROIX, Brigitte
233425 Laboratoire des Sciences des Procédés et des Matériaux [LSPM]
PINAULT, M
1400 Laboratoire Francis PERRIN [LFP - URA 2453]
FAURIE, D
233425 Laboratoire des Sciences des Procédés et des Matériaux [LSPM]
CASTELNAU, Olivier
86289 Procédés et Ingénierie en Mécanique et Matériaux [Paris] [PIMM]
LAUNOIS, P
134 Laboratoire de Physique des Solides [LPS]
ROUZIERE, S
134 Laboratoire de Physique des Solides [LPS]

URI
http://hdl.handle.net/10985/10146
DOI
10.1107/S0021889811049107
Date
2012
Journal
Journal of Applied Crystallography

Abstract

A prototype X-ray pixel area detector (XPAD3.1) has been used for X-ray diffraction experiments with synchrotron radiation. The characteristics of this detector are very attractive in terms of fast readout time, high dynamic range and high signal-to-noise ratio. The prototype XPAD3.1 enabled various diffraction experiments to be performed at different energies, sample-to-detector distances and detector angles with respect to the direct beam, yet it was necessary to perform corrections on the diffraction images according to the type of experiment. This paper is focused on calibration and correction procedures to obtain high-quality scientific results specifically developed in the context of three different experiments, namely mechanical characterization of nanostructured multilayers, elastic-plastic deformation of duplex steel and growth of carbon nanotubes.

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