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Study of the Influence of the Fabrication Process Imperfections on the Performances of a Claw Pole Synchronous Machine Using a Stochastic Approach

Article dans une revue avec comité de lecture
Auteur
LIU, Sijun
MAC, Hung
MIPO, Jean-Claude
218959 Valeo Engine Cooling
ccCOOREVITS, Thierry
211915 Mechanics surfaces and materials processing [MSMP]
ccCLENET, Stephane
13338 Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]

URI
http://hdl.handle.net/10985/10557
DOI
10.1109/TMAG.2015.2477848
Date
2015
Journal
IEEE Transactions on Magnetics

Résumé

In mass production, fabrication processes of electrical machines are not perfectly repeatable with time, leading to dispersions on the dimensions which are not equal to their nominal values. The issue is then to link the dispersions on the dimensions which are uncertain to the performances of electrical machines in order to evaluate their influence. To deal with uncertainty, there is a growing interest in the stochastic approach, which consists in modelling the uncertain parameters with random variables. In fact, this approach enables to quantify the influence of the variability of the uncertain parameters on the variability of the quantities of interest. In this paper, a stochastic approach coupled with a 3D Finite Element model is used to study the influence of the fabrication process imperfections like the rotor eccentricity and the stator deformation on the performances of a claw pole synchronous machine.

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  • Laboratoire d'Electrotechnique et d'Electronique de Puissance (L2EP) de Lille

Documents liés

Visualiser des documents liés par titre, auteur, créateur et sujet.

  • Comparison of two approaches to compute magnetic field in problems with random domains 
    Article dans une revue avec comité de lecture
    MAC, Duy Hung; ccCLENET, Stephane; MIPO, Jean-Claude (Institution of Engineering and Technology, 2012)
    Methods are now available to solve numerically electromagnetic problems with uncertain input data (behaviour law or geometry). The stochastic approach consists in modelling uncertain data using random variables. Discontinuities ...
  • Transformation Methods for Static Field Problems With Random Domains 
    Article dans une revue avec comité de lecture
    MAC, Duy Hung; ccCLENET, Stephane; MIPO, Jean-Claude (Institute of Electrical and Electronics Engineers, 2011)
    The numerical solution of partial differential equations onto random domains can be done by using a mapping transforming this random domain into a deterministic domain. The issue is then to determine this one to one random ...
  • Solution of Static Field Problems With Random Domains 
    Article dans une revue avec comité de lecture
    MAC, Duy Hung; MIPO, Jean-Claude; MOREAU, Olivier; ccCLENET, Stephane (Institute of Electrical and Electronics Engineers, 2010)
    A method to solve stochastic partial differential equations on random domains consists in using a one-to-one random mapping function which transforms the random domain into a deterministic domain. With this method, the ...
  • A priori error indicator in the transformation method for problems with geometric uncertainties 
    Article dans une revue avec comité de lecture
    MAC, Duy Hung; MIPO, Jean-Claude; TSUKERMAN, Igor; ccCLENET, Stephane (Institute of Electrical and Electronics Engineers, 2013)
    To solve stochastic problems with geometric uncertainties, one can transform the original problem in a domain with stochastic boundaries and interfaces to a problem defined in a deterministic domain with uncertainties in ...
  • The effect of punching on electrical machine 
    Article dans une revue avec comité de lecture
    EL YOUSSEF, Mohamad; BENABOU, AbdelKader; VAN GORP, Adrien; FAVEROLLE, Pierre; MIPO, Jean-Claude; LAVALLEY, Yannick; LECUPPE, Thomas; ccCOOREVITS, Thierry; ccCLENET, Stephane (IOS Press, 2019)
    This work enlightens the impact of punching on a specific stator performances. Two specimens type are withdrawn from a M330A35 punched lamination sheet. One type represents a closed magnetic circuit while the other represents ...

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