Determination of deviatoric elastic strain and lattice orientation by applying digital image correlation to Laue microdiffraction images: The enhanced Laue-DIC method
TypeArticles dans des revues avec comité de lecture
A new method of determining the deviatoric elastic strain and lattice orientation from Laue microdiffraction images is presented. Standard data treatment methods can suffer from the difficulty of precisely pinpointing the positions of diffraction peaks on two-dimensional Laue images. In a previous article, digital image correlation (DIC) was introduced for the treatment of Laue images, leading to the so-called Laue-DIC method. This performed better than the standard method in terms of the deviatoric elastic strain increment and relative rotation from one lattice to another, particularly when the shape of the Laue spots departs from regular ellipsoids. The present work intends to push forward the Laue-DIC method, aiming to determine the deviatoric elastic strain and lattice orientation, as well as the calibration parameters. The performance of this new method, named enhanced Laue-DIC, is assessed by modeling the spot displacements and accounting for random fluctuations relevant for typical experimental conditions. When the enhanced Laue-DIC method is applied to the case of an in situ deformed Si crystal, the obtained standard deviation of local stress is of the order of 1-2 MPa, while the calibration parameters are optimized to high accuracy.
Showing items related by title, author, creator and subject.
On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment PLANCHER, Emeric; PETIT, Johann; MAURICE, Claire; FAVIER, Véronique; SAINTOYANT, Lucie; LOISNARD, Dominique; RUPIN, N.; MARIJON, Jean Baptiste; ULRICH, Olivier; BORNERT, Michel; MICHA, Jean Sébastien; ROBACH, Odile; CASTELNAU, Olivier (Springer New York LLC, 2016)Determining the accuracy of elastic strain measurements in plastically deformed alloys is an experimental challenge. To develop a novel cross-validation procedure, a controlled elasto-plastic strain gradient was created ...
Direct measurement of local constitutive relations, at the micrometre scale, in bulk metallic alloys PLANCHER, E; MAURICE, C; FAVIER, V; LOISNARD, D; RUPIN, N; MARIJON, Jean-Baptiste; MICHA, Jean-Sébastien; ROBACH, Odile; CASTELNAU, Olivier; BOSSO, E; STODOLNA, J; PETIT, J (International Union of Crystallography, 2017)Multiscale models involving crystal plasticity are essential to predict the elastoplastic behavior of structural materials with respect to their microstructure. However, those models are often limited by a poor knowledge ...
ROBACH, Odile; KIRCHLECHNER, Christoph; MICHA, Jean Sébastien; ULRICH, M. Olivier; BIQUARD, Xavier; GEAYMOND, M. Olivier; CASTELNAU, Olivier; BORNERT, Michel; PETIT, Johann; BERVEILLER, Sophie; SICARDY, Olivier; VILLANOVA, Julie; RIEUTORD, François (mperial College Press, 2014)This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction ...
Validity of Crystal Plasticity Models Near Grain Boundaries: Contribution of Elastic Strain Measurements at Micron Scale PLANCHER, E.; TAJDARY, Pouya; AUGER, Thierry; CASTELNAU, Olivier; LOISNARD, Dominique; MARIJON, Jean Baptiste; MAURICE, Claire; MICHEL, Vincent; ROBACH, Odile; STODOLNA, Julien (Minerals, Metals and Materials Society, 2019)Synchrotron Laue microdiffraction and digital image correlation measurements were coupled to track the elastic strain field (or stress field) and the total strain field near a general grain boundary in a bent bicrystal. A ...
Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution PETIT, Johann; BORNERT, Michel; HOFMANN, Felix A.; ROBACH, Odile; MICHA, Jean Sébastien; ULRICH, Olivier; LE BOURLOT, Christophe; FAURIE, Damien; KORSUNSKY, Alexander; CASTELNAU, Olivier (Elsevier, 2012)The X-ray Laue microdiffraction technique, available at beamline BM32 on the synchrotron ESRF, is ideally suited for probing the field of elastic strain (and associated stress) in deformed polycrystalline materials with a ...