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Mechanical behavior of polycrystalline materials

Chapitre d'ouvrage scientifique
Auteur
CASTELNAU, Olivier
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]

URI
http://hdl.handle.net/10985/18677
Date
2011

Résumé

From the mechanical point of view, polycrystalline materials have to be considered as a specific class of composites. They are composed of many grains, with grains size ranging from nm to cm scales. Grains are generally assembled in a random way, i.e. their size, shape, and lattice orientation do not depend on the size, shape, and orientation of the surrounding grains (figure 1). Therefore, the microstructure of polycrystals can hardly be described exactly. Most of the time, one can only access a statistical characterization of grain arrangement e.g. with the help of cross-correlation functions. In the Euler orientation space, microstructure description is generally limited to the distribution of crystal lattice orientations (Orientation Distribution Function, ODF, or crystallographic texture).

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Documents liés

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  • Laue microdiffraction at the ESRF 
    Chapitre d'ouvrage scientifique
    ROBACH, Odile; KIRCHLECHNER, Christoph; MICHA, Jean Sébastien; ULRICH, M. Olivier; BIQUARD, Xavier; GEAYMOND, M. Olivier; CASTELNAU, Olivier; BORNERT, Michel; PETIT, Johann; SICARDY, Olivier; VILLANOVA, Julie; RIEUTORD, François; ccBERVEILLER, Sophie (mperial College Press, 2014)
    This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction ...
  • X-ray strain analysis of {111} fiber-textured thin films independent of grain-interaction models 
    Article dans une revue avec comité de lecture
    FAURIE, Damien; RENAULT, Pierre Olivier; LE BOURHIS, E; CHAUVEAU, Thierry; CASTELNAU, Olivier; GOUDEAU, Philippe H. (International Union of Crystallography, 2011)
    The anisotropic elastic response of supported thin films with a {111} fiber texture has been studied using an in-situ micro-tensile tester and X-ray diffractometry. It is shown which specific X-ray diffraction measurement ...
  • Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution 
    Communication avec acte
    PETIT, Johann; BORNERT, Michel; HOFMANN, Felix A.; ROBACH, Odile; MICHA, Jean Sébastien; ULRICH, Olivier; LE BOURLOT, Christophe; FAURIE, Damien; KORSUNSKY, Alexander; CASTELNAU, Olivier (Elsevier, 2012)
    The X-ray Laue microdiffraction technique, available at beamline BM32 on the synchrotron ESRF, is ideally suited for probing the field of elastic strain (and associated stress) in deformed polycrystalline materials with a ...
  • Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction 
    Article dans une revue avec comité de lecture
    DJAZIRI, Soundes; THIAUDIÈRE, Dominique; GEANDIER, Guillaume; RENAULT, Pierre Olivier; LE BOURHIS, Éric; GOUDEAU, P; CASTELNAU, Olivier; FAURIE, D (Elsevier, 2010)
    The deformation behaviour of 150. nm thick W/Cu nanocomposite deposited on polyimide substrates has been analysed under equi-biaxial tensile testing coupled to X-ray diffraction technique. The experiments were carried out ...
  • Multiscale modeling of the elasto-plastic behavior of architectured and nanostructured Cu-Nb composite wires and comparison with neutron diffraction experiments 
    Article dans une revue avec comité de lecture
    GU, T.; MEDY, J. R.; KLOSEK, Vincent; CASTELNAU, Olivier; FOREST, Samuel; HERVÉ-LUANCO, Eveline; LECOUTURIER-DUPOUY, F.; PROUDHON, Henry; RENAULT, Pierre Olivier; THILLY, Ludovic; VILLECHAISE, Patrick (Elsevier, 2019)
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