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Electromagnetic performance of Ti6Al4V and AlSi7Mg0.6 waveguides with laser beam melting (LBM) produced and abrasive flow machining (AFM) finished internal surfaces

Article dans une revue avec comité de lecture
Author
FRANÇOIS, Mathieu
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]
HAN, Sangil
126765 École Centrale de Lyon [ECL]
ccSEGONDS, Frederic
127758 Laboratoire Conception de Produits et Innovation [LCPI]
DUPUY, Corinne
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]
ccRIVETTE, Mickaël
107452 Laboratoire de Conception Fabrication Commande [LCFC]
TURPAULT, Simon
555382 Thales SIX GTS France
MIMOUNA, Mehdi
555382 Thales SIX GTS France
SALVATORE, Ferdinando
126765 École Centrale de Lyon [ECL]
RECH, Joël
126765 École Centrale de Lyon [ECL]
PEYRE, Patrice
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]

URI
http://hdl.handle.net/10985/21276
DOI
10.1080/09205071.2021.1954554
Date
2021
Journal
Journal of Electromagnetic Waves and Applications

Abstract

Metal additive manufacturing processes, such as laser beam melting (LBM), can play a key role in developing antenna-feed chains because monolithic and multifunctional parts can be manufactured with high geometric freedom in the design phase. Using LBM technology, lighter and more compact antennas can be produced and manufac-turing costs can be reduced. However, the surface roughness of internal surfaces in waveguides produced by LBM is much higher (about 10 μm Ra) than that produced by conventional manufacturing tech-nologies. Consequently, such high surface roughness of the internal surface can affect electrical current propagation through the waveguide and corresponding transmitted power. In this paper, abrasive flow machining (AFM) was used to reduce the surface roughness of the internal surfaces of four different waveguides used at both K and Q bands. A significant reduction in the transmission loss at both K and Q bands was observed as their internal surface rough-ness decreased from about 10 μmto1μm Ra. This was assumed to be due to an increase of the internal surface electrical conductivity with the decrease of roughness in waveguides channels.

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