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A compter du 1er janvier 2026 le portail institutionnel "HAL - Arts et Métiers Sciences et Technologies" remplacera l'archive ouverte SAM qui ne sera plus mise à jour. Pour permettre un alignement des données entre ces deux sites, les dépôts dans SAM seront arrêtés à compter du 28 novembre 2025 (17h). Pendant tout le mois de décembre l'équipe d'administration de SAM est joignable à cette adresse pour toute question sur le passage au portail "Hal- Arts et Métiers Sciences et Technologies" : scienceouverte@ensam.eu Merci de votre compréhension

Front glass crack inspection of thin-film solar photovoltaic modules using high-order ultrasonic Lamb waves

Article dans une revue avec comité de lecture
Author
SILITONGA, Dicky
24541 Georgia Tech Lorraine [Metz]
DECLERCQ, Nico F.
216445 George W. Woodruff School of Mechanical Engineering
24541 Georgia Tech Lorraine [Metz]
ccMERAGHNI, Fodil
178323 Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux [LEM3]
BOUSSERT, Bertrand
24541 Georgia Tech Lorraine [Metz]

URI
http://hdl.handle.net/10985/25346
DOI
10.1016/j.solener.2024.112578
Date
2024-05
Journal
Solar Energy

Abstract

Ensuring the structural integrity of solar photovoltaic modules is crucial to maintain power production efficiency and fulfill the anticipated product lifespan. Hence, implementing quality control procedures and structural health monitoring is necessary throughout the stages of manufacture and operation. The ultrasonic examination has some benefits compared to electroluminescence and infrared approaches, namely in identifying mechanical flaws in the front glass. The Lamb waves (LW) method is an auspicious inspection approach among ultrasonic-based methods. This is primarily attributed to its quicker measurement speed than the standard ultrasonic c-scan. The LW method offers an advantage in terms of its ability to provide long-range coverage. The predominant approach in LW inquiry often centers on using fundamental modes within the low-frequency range. Nevertheless, the findings of this investigation demonstrate that the higher-order mode exhibits superior effectiveness for the specific objective of this research, as it displays a higher level of sensitivity towards cracks in the front glass of the module. The current study ultimately showcases the use of the LW scan. A damage indication threshold is determined by the fraction of energy spectral density (ESD) associated with the crack-sensitive mode. This technology effectively produces a comprehensive map of the designated area by comparing the ESD values at various measurement positions with a predetermined threshold. This map provides precise indications of the existence of areas that are affected by cracks.

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