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X-ray Diffraction Residual Stress Measurement at Room Temperature and 77 K in a Microelectronic Multi-layered Single-Crystal Structure Used for Infrared Detection
Article dans une revue avec comité de lecture
(Institute of Electrical and Electronics Engineers, 2018)
Multilayer CdHgTe-based infrared detector: 2D/3D microtomography, synchrotron emission and finite element modelling with stress distribution at room temperature and 100 K
Article dans une revue avec comité de lecture
(Elsevier, 2020)