Search

Now showing items 1-2 of 2

A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction

Article dans une revue avec comité de lecture

MARCISZKO, Marianna; WAWSZCZAK, Roman; SIDHOM, Habib; BRAHAM, Chedly; WROBEL, Mirosław; WRONSKI, Sebastian; OPONOWICZ, Adrian; GENZEL, Christoph; KLAUS, Manuela; BACZMANSKI, Andrzej (International Union of Crystallography, 2018)

Multireflection grazing-incidence X-ray diffraction: A new approach to experimental data analysis

Article dans une revue avec comité de lecture

MARCISZKO-WIĄCKOWSKA, Marianna; OPONOWICZ, Adrian; BACZMANSKI, Andrzej; WRÓBEL, Mirosław X.; BRAHAM, Chedly; WAWSZCZAK, Roman (International Union of Crystallography, 2019)