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A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction

Article dans une revue avec comité de lecture
Author
MARCISZKO, Marianna
445585 AGH University of Science and Technology [Krakow, PL] [AGH UST]
WAWSZCZAK, Roman
445585 AGH University of Science and Technology [Krakow, PL] [AGH UST]
SIDHOM, Habib
90606 Ecole Supérieure des Sciences et Techniques [Tunis] [ESSTT]
WROBEL, Mirosław
445585 AGH University of Science and Technology [Krakow, PL] [AGH UST]
WRONSKI, Sebastian
445585 AGH University of Science and Technology [Krakow, PL] [AGH UST]
OPONOWICZ, Adrian
445585 AGH University of Science and Technology [Krakow, PL] [AGH UST]
GENZEL, Christoph
KLAUS, Manuela
BACZMANSKI, Andrzej
445585 AGH University of Science and Technology [Krakow, PL] [AGH UST]
ccBRAHAM, Chedly
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]

URI
http://hdl.handle.net/10985/14077
DOI
10.1107/S1600576718004193
Date
2018
Journal
Journal of Applied Crystallography

Abstract

The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure depth-dependent stress variation in near-surface layers of a Ti sample (grade 2) subjected to different mechanical treatments. First, the multireflection grazing incidence diffraction method was applied on a classical diffractometer with Cu Kα radiation. The applicability of the method was then extended by using a white synchrotron beam during an energy dispersive (ED) diffraction experiment. An advantage of this method was the possibility of using not only more than one reflection but also different wavelengths of radiation. This approach was successfully applied to analysis of data obtained in the ED experiment. There was good agreement between the measurements performed using synchrotron radiation and those with Cu Kα radiation on the classical diffractometer. A great advantage of high-energy synchrotron radiation was the possibility to measure stresses as well as the a0 parameter and c0/α0 ratio for much larger depths in comparison with laboratory X-rays. © 2018 International Union of Crystallography.

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