A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
TypeArticles dans des revues avec comité de lecture
The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure depth-dependent stress variation in near-surface layers of a Ti sample (grade 2) subjected to different mechanical treatments. First, the multireflection grazing incidence diffraction method was applied on a classical diffractometer with Cu Kα radiation. The applicability of the method was then extended by using a white synchrotron beam during an energy dispersive (ED) diffraction experiment. An advantage of this method was the possibility of using not only more than one reflection but also different wavelengths of radiation. This approach was successfully applied to analysis of data obtained in the ED experiment. There was good agreement between the measurements performed using synchrotron radiation and those with Cu Kα radiation on the classical diffractometer. A great advantage of high-energy synchrotron radiation was the possibility to measure stresses as well as the a0 parameter and c0/α0 ratio for much larger depths in comparison with laboratory X-rays. © 2018 International Union of Crystallography.
Showing items related by title, author, creator and subject.
Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction MARCISZKO, Marianna; BACZMANSKI, Andrzej; MIROSŁAW, Wrobel; SEILER, Wilfrid; BRAHAM, Chedly; WRONSKI, Sebastian; WAWSZCZAK, Roman (International Union of Crystallography, 2015)Multireflection grazing-incidence X-ray diffraction (MGIXD) was used to determine the stress- and strain-free lattice parameter in the surface layer of mechanically treated (polished and ground) tungsten and austenitic ...
MARCISZKO-WIĄCKOWSKA, Marianna; OPONOWICZ, Adrian; BACZMANSKI, Andrzej; WRÓBEL, Mirosław X.; BRAHAM, Chedly; WAWSZCZAK, Roman (International Union of Crystallography, 2019)The multireflection grazing-incidence X-ray diffraction method is used to test surface stresses at depths of several micrometres in the case of metal samples. This work presents new ways of analysing experimental data ...
Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles MARCISZKO, Marianna; BACZMANSKI, Andrzej; BRAHAM, Chedly; WROBEL, Mirosław; WRONSKI, Sebastian; CIOS, Grzegorz (Elsevier, 2017)The presented study introduces the development of the multi-reflection grazing-incidence X-ray diffraction method (MGIXD) for residual stress determination. The proposed new methodology is aimed at obtaining more reliable ...
Application of multireﬂection grazing incidence method for stress measurements in polished Al–Mg alloy and CrN coating MARCISZKO, Marianna; BACZMANSKI, Andrzej; WIERZBANOWSKI, K; WROBEL, Mirosław; BRAHAM, Chedly; CHOPART, J.-P.; LODINI, A; BONARSKI, J; TARKOWSKI, L.; ZAZI, N (Elsevier, 2012)Multi-reﬂection grazing incidence geometry, referred to as MGIXD, characterized by a small and constant incidence angle, was applied to measure low surface stresses in very thin layers of Al–Mg alloy and CrN coating. These ...
Evolution of microstructure and residual stress during annealing of austenitic and ferritic steels BACZMANSKI, Andrzej; MARCISZKO, Marianna; WRÓBEL, Mirosław X.; SZTWIERTNIA, Krzysztof; BRAHAM, Chedly; BERENT, Katarzyna (Elsevier Inc., 2016)In this work the recovery and recrystallization processes occurring in ferritic and austenitic steels were studied. To determine the evolution of residual stresses during material annealing the nonlinear sin 2 ψ diffraction ...