Reliability Estimation by ALT when no Analytical Model Holds

Abstract

This paper presents an accelerated life testing method applicable to devices or systems when no analytical relationship with respect to the stress level can be defined. If a numerical approach remains possible, the numerical model can be fitted to the accelerated test results. Thus, long-term failures can be predicted from short tests. This method is carried out in the case of fatigue, the evolution of the damage leading to the failure having to be modeled by a numerical finite element method.