Imperfection-sensitive ductility of aluminium thin films
Article dans une revue avec comité de lecture
Author
COULOMBIER, MarcBOE, AlexandreRASKIN, Jean.PierrePARDOEN, Therry 
BRUGGER, CharlesAbstract
Ductility, defined as the strain at the onset of necking, has been characterized in thin Al films using an on-chip, internal stress actuated, microtensile testing setup. In the smallest specimens, the ductility is equal to 0.08 and 0.27 for 200 and 375 nm thick films, respectively, while the average strain-hardening exponents are, respectively, equal to 0.11 and 0.23. In addition to the thickness effect, ductility decreases with increasing specimen size due to imperfection sensitivity, involving a size-dependent statistical behaviour.
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