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Estimation of Thermal Resistance Field in Layered Materials by Analytical Asymptotic Method

Article dans une revue avec comité de lecture
Author
GROZ, Marie-Marthe
439445 EPSILON [EPSILON]
BENSALEM, Mohamed
SOMMIER, Alain
ccABISSET-CHAVANNE, Emmanuelle
ccCHEVALIER, Stéphane
1002421 Institut de Mécanique et d'Ingénierie [I2M]
CHULKOW, Arsenii
571515 QUAMER laboratory , Tomsk State University
ccBATTAGLIA, Jean-Luc
BATSALE, Jean-Christophe
PRADERE, Christophe

URI
http://hdl.handle.net/10985/20465
DOI
10.3390/app10072351
Date
2020
Journal
Applied Sciences

Abstract

In this paper, the problem of the quantitative characterization of thermal resistance fields in a multilayer sample is addressed by using the classical front face flash method as the thermal excitation and infrared thermography (IRT) as the monitoring sensor. In this challenging problem, the complete inverse processing of a multilayer analytical model is difficult due to the lack of sensitivity of some parameters (layer thickness, depth of thermal resistance, etc.) and the expansive computational iterative processing. For these reasons, the proposed strategy is to use a simple multilayer problem where only one resistive layer is estimated. Moreover, to simplify the inverse processing often based on iterative methods, an asymptotic development method is proposed here. Regarding the thermal signal reconstruction (TSR) methods, the drawback of these methods is the inability to be quantitative. To overcome this problem, the method incorporates a calibration process originating from the complete analytical quadrupole solution to the thermal problem. This analytical knowledge allows self-calibration of the asymptotic method. From this calibration, the quantitative thermal resistance field of a sample can be retrieved with a reasonable accuracy lower than 5%.

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