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The periodic pulse photothermal radiometry technique within the front face configuration

Article dans une revue avec comité de lecture
Author
ccBATTAGLIA, Jean-Luc
RUFFIO, Emmanuel
KUSIAK, Andrzej
PRADERE, Christophe
ccABISSET CHAVANNE, Emmanuelle
58355 École Nationale Supérieure des Arts et Métiers [ENSAM]
ccCHEVALIER, Stéphane
SOMMIER, Alain
BATSALE, Jean-Christophe
1002421 Institut de Mécanique et d'Ingénierie [I2M]

URI
http://hdl.handle.net/10985/20466
DOI
10.1016/j.measurement.2020.107691
Date
2020
Journal
Measurement

Abstract

The front face photothermal radiometry technique has been improved in order to estimate the thermal conductivity of thin films with better accuracy compared to existing techniques. The experimental pro- cedure is based on the front face response to a nanoseconds laser pulse repeated periodically at high fre- quency, i. e., a Dirac comb waveform. Averaging the thermal response by considering thousands successive pulses allows improving largely the signal noise ratio. The unknown thermal properties and related experimental parameters are identified by minimizing the gap between the measured signal and the theoretical response that accounts with the pulse waveform, the repetition frequency and the detector transfer function. Minimization is first achieved by implementing first a simplex technique that gives an initial set of values to start the Metropolis–Hastings algorithm in a second step. Application of the proposed methodology is done considering amorphous GeTe film deposited on a Si wafer. It is shown that this experimental method as well as the implementation of the Bayes minimization technique allows to identify the thin film intrinsic thermal conductivity with high accuracy considering some uncertainty on the other parameters assumed to be known.

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