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The dependence of X-ray elastic constants with respect to the penetration depth

Article dans une revue avec comité de lecture
Author
ccMAREAU, Charles
211916 Laboratoire Angevin de Mécanique, Procédés et InnovAtion [LAMPA]

URI
http://hdl.handle.net/10985/24383
DOI
10.1107/s1600576723006878
Date
2023-09-01
Journal
Journal of Applied Crystallography

Abstract

X-ray diffraction techniques are widely used to estimate stresses within polycrystalline materials. The application of these techniques requires the knowledge of the X-ray elastic constants relating the lattice strains to the stress state. Different analytical methods have been proposed to evaluate the X-ray elastic constants from the single-crystal elastic constants. For a given material, such methods provide the bulk X-ray elastic constants but they do not consider the role of free surfaces. However, for many practical applications of X-ray diffraction techniques, the penetration depth of X-rays is the same order of magnitude as the grain size, which means that the influence of the free surface on X-ray elastic constants cannot be excluded. In the present work, a numerical procedure is proposed to evaluate the surface and bulk X-ray elastic constants of polycrystalline materials. While the former correspond to the situation where the penetration is infinitely small in comparison with the grain size, the latter are representative of an infinite penetration depth with no free-surface effect. According to numerical results, the difference between surface and bulk X-ray elastic constants is important for strongly anisotropic crystals. Also, it is possible to propose a relation that allows evaluating X-ray elastic constants as a function of the ratio between the penetration depth and the average grain size. The corresponding parameters of such a relation are provided here for many engineering materials.

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