Inter- and Intragranular Stress Determination with Kossel Microdiffraction in a Scanning Electron Microscope
Article dans une revue avec comité de lecture
A Kossel microdiffraction experimental set up is under development inside a Scanning Electron Microscope (SEM) in order to determine the crystallographic orientation as well as the inter- and intragranular strains and stresses on the micron scale, using a one cubic micrometer spot. The experimental Kossel line patterns are obtained by way of a CCD camera and are then fully indexed using a home-made simulation program. The so-determined orientation is compared with Electron Back-Scattered Diffraction (EBSD) results, and in-situ tests are performed inside the SEM using a tensile/compressive machine. The aim is to verify a 50MPa stress sensitivity for this technique and to take advantage from this microscope environment to associate microstructure observations (slip lines, particle decohesion, crack initiation) with determined stress analyses.
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Article dans une revue avec comité de lecturePESCI, Raphaël; INAL, Karim; BERVEILLER, Marcel; LEBRUN, Jean-Lou (Trans Tech Publications Inc, 2002)The behavior and the fracture mechanisms of the 16MND5 bainitic pressure vessel steel are studied using a local approach of fracture on a crystallographic scale. A series of tensile tests are performed on the material ...
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Article dans une revue avec comité de lectureKossel microdiffraction in a scanning electron microscope enables determination of local elastic strains. With Kossel patterns recorded by a CCD camera and some automation of the strain determination process, this technique ...
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