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Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles

Article dans une revue avec comité de lecture
Author
MARCISZKO, Marianna
BACZMANSKI, Andrzej
WROBEL, Mirosław
WRONSKI, Sebastian
CIOS, Grzegorz
ccBRAHAM, Chedly
86289 Laboratoire Procédés et Ingénierie en Mécanique et Matériaux [PIMM]

URI
http://hdl.handle.net/10985/11657
DOI
10.1016/j.actamat.2016.10.029
Date
2017
Journal
Acta Materialia

Abstract

The presented study introduces the development of the multi-reflection grazing-incidence X-ray diffraction method (MGIXD) for residual stress determination. The proposed new methodology is aimed at obtaining more reliable experimental data and increasing the depth of non-destructive stress determination below the sample surface. To verify proposed method measurements were performed on a classical X-ray diffractometer (Cu Kα radiation) and using synchrotron radiation (three different wavelengths: λ = 1.2527 Å, λ = 1.5419 Å and λ = 1.7512 Å). The Al2017 alloy subjected to three different surface treatments was investigated in this study. The obtained results showed that the proposed development of MGIXD method, in which not only different incident angles but also different wavelengths of X-ray are used, can be successfully applied for residual stress determination, especially when stress gradients are present in the sample.

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