Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction
Article dans une revue avec comité de lecture
JournalJournal of Applied Crystallography
Multireflection grazing-incidence X-ray diffraction (MGIXD) was used to determine the stress- and strain-free lattice parameter in the surface layer of mechanically treated (polished and ground) tungsten and austenitic steel. It was shown that reliable diffraction stress analysis is possible only when an appropriate grain interaction model is applied to an anisotropic sample. Therefore, verification of the X-ray stress factors (XSFs) was accomplished by measuring relative lattice strains during an in situ tensile test. The results obtained using the MGIXD and standard methods ( and geometries) show that the Reuss and free-surface grain interaction models agree with the experimental data. Moreover, a new interpretation of the MGIXD results was proposed and applied for the first time to measure the probability of stacking faults as a function of penetration depth for a polished and ground austenitic sample. The XSF models verified in the tensile test were used in the analysis of residual stress components.
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