Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction
TypeArticles dans des revues avec comité de lecture
Multireflection grazing-incidence X-ray diffraction (MGIXD) was used to determine the stress- and strain-free lattice parameter in the surface layer of mechanically treated (polished and ground) tungsten and austenitic steel. It was shown that reliable diffraction stress analysis is possible only when an appropriate grain interaction model is applied to an anisotropic sample. Therefore, verification of the X-ray stress factors (XSFs) was accomplished by measuring relative lattice strains during an in situ tensile test. The results obtained using the MGIXD and standard methods ( and geometries) show that the Reuss and free-surface grain interaction models agree with the experimental data. Moreover, a new interpretation of the MGIXD results was proposed and applied for the first time to measure the probability of stacking faults as a function of penetration depth for a polished and ground austenitic sample. The XSF models verified in the tensile test were used in the analysis of residual stress components.
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Stress distribution correlated with damage in duplex stainless steel studied by synchrotron diffraction during plastic necking ZHAO, Yuchen; LE JONCOUR, L; BACZMANSKI, Andrzej; GADALIŃSKA, E; WRONSKI, Sebastian; PANICAUD, B; FRANÇOIS, M; BRAHAM, Chedly; BUSLAPS, T (Elsevier, 2017)The goal of this work was the determination of lattice strains distribution in two phases of duplex steel during plastic necking. Subsequently, the stress heterogeneity in the neck was studied in order to determine the ...
Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles MARCISZKO, Marianna; BACZMANSKI, Andrzej; BRAHAM, Chedly; WROBEL, Mirosław; WRONSKI, Sebastian; CIOS, Grzegorz (Elsevier, 2017)The presented study introduces the development of the multi-reflection grazing-incidence X-ray diffraction method (MGIXD) for residual stress determination. The proposed new methodology is aimed at obtaining more reliable ...
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A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction MARCISZKO, Marianna; WAWSZCZAK, Roman; SIDHOM, Habib; BRAHAM, Chedly; WROBEL, Mirosław; WRONSKI, Sebastian; OPONOWICZ, Adrian; GENZEL, Christoph; KLAUS, Manuela; BACZMANSKI, Andrzej (Wiley-Blackwell, 2018)The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure ...
Application of multireﬂection grazing incidence method for stress measurements in polished Al–Mg alloy and CrN coating MARCISZKO, Marianna; BACZMANSKI, Andrzej; WIERZBANOWSKI, K; WROBEL, Mirosław; BRAHAM, Chedly; CHOPART, J.-P.; LODINI, A; BONARSKI, J; TARKOWSKI, L.; ZAZI, N (Elsevier, 2012)Multi-reﬂection grazing incidence geometry, referred to as MGIXD, characterized by a small and constant incidence angle, was applied to measure low surface stresses in very thin layers of Al–Mg alloy and CrN coating. These ...