Multireflection grazing incidence diffraction used for stress measurementsin surface layers
TypeArticles dans des revues avec comité de lecture
The geometry based on the multireflection grazing incidence X-ray diffraction can be applied to measure residual stresses. Using this method, it is possible to perform a non-destructive analysis of the heterogeneous stresses for different and well defined volumes below the surface of the sample (range of several μm). As the result, the average values of stresses weighted by absorption of X-ray radiation are measured. In this work the stress profiles as a function of penetration depth were determined for mechanically polished Al sample. Measurements and verification of the method were performed using classical X-ray diffractometer and synchrotron radiation with different wavelengths.
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Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction MARCISZKO, Marianna; BACZMANSKI, Andrzej; MIROSŁAW, Wrobel; SEILER, Wilfrid; BRAHAM, Chedly; WRONSKI, Sebastian; WAWSZCZAK, Roman (International Union of Crystallography, 2015)Multireflection grazing-incidence X-ray diffraction (MGIXD) was used to determine the stress- and strain-free lattice parameter in the surface layer of mechanically treated (polished and ground) tungsten and austenitic ...
Application of multireﬂection grazing incidence method for stress measurements in polished Al–Mg alloy and CrN coating MARCISZKO, Marianna; BACZMANSKI, Andrzej; WIERZBANOWSKI, K; WROBEL, Mirosław; BRAHAM, Chedly; CHOPART, J.-P.; LODINI, A; BONARSKI, J; TARKOWSKI, L.; ZAZI, N (Elsevier, 2012)Multi-reﬂection grazing incidence geometry, referred to as MGIXD, characterized by a small and constant incidence angle, was applied to measure low surface stresses in very thin layers of Al–Mg alloy and CrN coating. These ...
Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles MARCISZKO, Marianna; BACZMANSKI, Andrzej; BRAHAM, Chedly; WROBEL, Mirosław; WRONSKI, Sebastian; CIOS, Grzegorz (Elsevier, 2017)The presented study introduces the development of the multi-reflection grazing-incidence X-ray diffraction method (MGIXD) for residual stress determination. The proposed new methodology is aimed at obtaining more reliable ...
A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction MARCISZKO, Marianna; WAWSZCZAK, Roman; SIDHOM, Habib; BRAHAM, Chedly; WROBEL, Mirosław; WRONSKI, Sebastian; OPONOWICZ, Adrian; GENZEL, Christoph; KLAUS, Manuela; BACZMANSKI, Andrzej (Wiley-Blackwell, 2018)The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure ...
Evolution of microstructure and residual stress during annealing of austenitic and ferritic steels BACZMANSKI, Andrzej; MARCISZKO, Marianna; WRÓBEL, Mirosław X.; SZTWIERTNIA, Krzysztof; BRAHAM, Chedly; BERENT, Katarzyna (Elsevier Inc., 2016)In this work the recovery and recrystallization processes occurring in ferritic and austenitic steels were studied. To determine the evolution of residual stresses during material annealing the nonlinear sin 2 ψ diffraction ...