Structural and magnetic properties of Co2MnSi thin films
Article dans une revue avec comité de lecture
Author
BELMEGUENAI, MZIGHEM, FFAURIE, DTUZCUOGLU, H.CHERIF, Salim MouradWESTERHOLT, KSEILER, WilfridMOCH, PAbstract
Co2MnSi (CMS) films of different thicknesses (20, 50, and 100 nm) were grown by radio frequency (RF) sputtering on a-plane sapphire substrates. Our X-rays diffraction (XRD) study shows that, in all the samples, the cubic 〈110〉 CMS axis is normal to the substrate and that six well defined preferential in-plane orientations are present. Static and dynamic magnetic properties were investigated using vibrating sample magnetometry (VSM) and microstrip line ferromagnetic resonance (MS-FMR), respectively. From the resonance measurements versus the direction and the amplitude of an applied magnetic field, most of the magnetic parameters are derived, i.e.: the magnetization, the gyromagnetic factor, the exchange stiffness coefficient, and the magnetic anisotropy terms. The in-plane anisotropy results from the superposition of two terms showing a twofold and a fourfold symmetry, respectively. The observed behavior of the hysteresis loops is in agreement with this complex form of the in-plane anisotropy.
Files in this item
Related items
Showing items related by title, author, creator and subject.
-
Article dans une revue avec comité de lecture(Elsevier, 2010)Elastic properties of non-textured and {1 1 1}-fiber-textured gold thin films were investigated experimentally by several complementary techniques, namely in situ tensile testing under X-ray diffraction (XRD), nanoindentation ...
-
Article dans une revue avec comité de lecture; ; ; ; ; ;
BRAHAM, Chedly (International Union of Crystallography, 2015)
Multireflection grazing-incidence X-ray diffraction (MGIXD) was used to determine the stress- and strain-free lattice parameter in the surface layer of mechanically treated (polished and ground) tungsten and austenitic ... -
Article dans une revue avec comité de lecture; ; ; ; ;BRAHAM, Chedly (Nihon Kinzoku Gakkai, 2012)
The influence of Sn on the microstructure, microstrain and grain morphology in Al–2Si–xSn samples processed by ECAP is reported and discussed. The pseudo-binary Al–xSn alloys (where x = 0, 4, 8 mass%) were produced by ...
-
Article dans une revue avec comité de lecture(2013)Indium oxide thin films were grown by the pulsed electron beam deposition method on c-cut sapphire substrates at 10−2 mbar oxygen pressure and temperature up to 500 1C. Such conditions lead to the formation of dense, smooth ...
-
Article dans une revue avec comité de lecture(Elsevier, 2014)Indium oxide thin films were grown by pulsed electron beam deposition method at 500 °C on c-cut sapphire and (0 0 1) oriented LaAlO3 single crystal substrates in oxygen or argon gas. The effects of ambient gas and substrate ...